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Increased the maximum TEM voltage from 1000 to 9000 keV. This version includes an improved crystal editor, higher TEM voltages, plus miscellaneous fixes and enhancements.Īuto-open Patterns List when importing a multi-structure file. As a result, zooming in to high magnifications should reveal smooth, continuous profiles, without abrupt steps. Thanks to the faster peak-profile generation, we are now able to simulate extremely-wide peak "tails" for Lorentzian and Pseudo-Voigt peak profiles. CrystalDiffract now uses multi threading to dramatically speed the process of profile calculation.
#Crystaldiffract index peak label update#
The Check for Update command is now available when running in "Demo Mode".įaster Profile Generation. (This corrects a potential - although very-rare - issue in which the program could become bogged down drawing excessive numbers of tickmarks when the minimum and maximum values were almost equal.)įixed a crash when clicking on the Recent Files button and the list is empty.įixed an issue showing the version in the About dialog. Improvements to the diffraction graph's y-axis scaling for very small values. Similarly, the Structure Factors data file uses "I(Integrated)" in place of "Intensity". For example, the integrated intensity column in the Reflexions list is now labelled as "I(int)". To avoid potential confusion between peak intensity (height) and integrated intensity (area), various "Intensity" labels have been renamed. This version includes miscellaneous fixes and enhancements.ĬMTX files containing numeric site labels (or labels whose first character begins with a numeral) can now be imported safely.